Search results for "Synchrotron Radiation Source"
showing 6 items of 6 documents
SAXS/WAXS study of the annealing process in quenched samples of isotactic poly(propylene)
1999
The structural rearrangement in samples of quenched isotactic poly(propylene) (iPP) submitted to different annealing treatments has been studied using simultaneous small- and wide-angle X-ray scattering (SAXS/WAXS) at the synchrotron radiation source of DESY, Hamburg. From a quantitative analysis of the WAXS profiles the values of the α-monoclinic, mesomorphic, and amorphous mass fractions coexisting in the material were determined. It is demonstrated that the SAXS patterns were characterized by two different long-period values that are attributed to α- and mesomorphic periodicity, respectively. The related α- and mesomorphic volume phase fractions, calculated from the analysis of the SAXS …
Synthesis and characterization of indium oxide at high pressures
2018
Introducción: La naturaleza es sorprendente pero a la vez limitada. A mi entender, nada tiene más potencial que aplicar el ingenio humano para modificar lo que nos rodea y crear algo completamente nuevo. La Física de la Materia Condensada es un campo que actualmente está ganando importancia en la Física moderna. En virtud de los éxitos logrados en Física de la Materia Condensada se han producido enormes avances en el campo de la electrónica cuántica, de los semiconductores y de la ciencia de materiales, teniendo como resultado numerosas aplicaciones tecnológicas que han cambiado nuestras vidas drásticamente en los últimos 50 años. Una de las ramas de la Física de la Materia Condensada es el…
Spin polarisation and dichroism in ARUPS from thin rare earth films
2001
Abstract In the present study, spin polarisation and dichroism were investigated in angular resolved VUV photoemission ARUPS from magnetised as well as paramagnetic rare earth surfaces. Thin Gd(0001) films were prepared epitaxially on W(110). The photoelectrons were excited by polarised synchrotron radiation from the BESSY I synchrotron radiation source. A SPLEED detector attached to an electron spectrometer mounted on a single axis goniometer was used for angular resolved spin analysis. The main part of this work focused on the characteristic surface state of Gd(0001) which shows a splitting, as previously observed by linear magnetic dichroism and spin polarised photoemission. The spin ana…
Study of the long-period changes in samples of isotactic poly(propylene) obtained by quenching from the melt and subsequent annealing at different te…
1997
The structural modifications induced in samples of isotactic poly(propylene) obtained by quenching from the melt at 100°C/s and subsequently annealed at 40, 60 and 80°C for different annealing times have been studied using simultaneous wide-angle and small-angle X-ray scattering at the synchrotron radiation source of DESY. The occurrance of two different long-period values is demonstrated. These values are related to the mesomorphic phase, existing in the starting quenched material, and to the α-monoclinic one, which settles during the annealing process, respectively.
Material quality characterization of CdZnTe substrates for HgCdTe epitaxy
2006
Cd1−xZnxTe (CZT) substrates were studied to investigate their bulk and surface properties. Imperfections in CZT substrates affect the quality of Hg1−xCdxTe (MCT) epilayers deposited on them and play a role in limiting the performance of infrared (IR) focal plane arrays. CZT wafers were studied to investigate their bulk and surface properties. Transmission and surface x-ray diffraction techniques, utilizing both a conventional closed-tube x-ray source as well as a synchrotron radiation source, and IR transmission micro-spectroscopy, were used for bulk and surface investigation. Synchrotron radiation offers the capability to combine good spatial resolution and shorter exposure times than conv…
Synchrotron radiation multiple diffraction study of Al0.304Ga0.172In0.524As MOVPE grown onto InP(001)
1997
Synchrotron radiation multiple diffraction in Renninger scanning (RS) geometry is used to characterise an Al0.304Ga0.172In0.524 As hetero-epitaxial layer MOVPE grown onto InP(001). (006) RS data for bulk, InP substrate and the quaternary layer were obtained using a new experimental set-up on station 7.6 at the Daresbury synchrotron radiation source. Examination of the multiple diffraction peak profiles reveal the epitaxial layers to have a higher mosaic spread than the underlying substrate materials. Measurements of the layer parallel lattice parameter a∥ = 5.8755 ± 0.003 A, as deduced from the tetragonal distortion measured at the 6-beam case in the layer RS, agrees very well with that obt…